Atomic force microscope (AFM)

Atomic force microscope (AFM) – sharp tip on a flexible cantilever scans the sample surface; a laser reflected off the…

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Atomic force microscope (AFM): sharp tip on a flexible cantilever scans the sample surface; a laser reflected off the cantilever onto a four-quadrant photodiode measures deflection, with piezo scanner and feedback, giving a 3D topography map

Atomic force microscope (AFM): sharp tip on a flexible cantilever scans the sample surface; a laser reflected off the cantilever onto a four-quadrant photodiode measures deflection, with piezo scanner and feedback, giving a 3D topography map. Flat illustration from the Sciicons Analytical Instruments pack (Pro).

Format: SVG (editable vector). License: Sciicons Pro license. Courtesy: Sciicons. Part of the Analytical Instruments pack.

Keywords: Analytical Instruments Pack, Sciicons Pro, AFM, atomic force microscope, atomic force microscopy, cantilever, scanning probe microscopy, SPM, topography, tip, analytical chemistry, instrument

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