Scanning electron microscope (SEM) column
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Scanning electron microscope (SEM) column: field-emission electron gun, anode, condenser lenses, scan coils and objective lens focusing a rastered probe on the specimen; secondary and backscattered electron detectors form the surface image
Scanning electron microscope (SEM) column: field-emission electron gun, anode, condenser lenses, scan coils and objective lens focusing a rastered probe on the specimen; secondary and backscattered electron detectors form the surface image. Flat illustration from the Sciicons Analytical Instruments pack (Pro).
Format: SVG (editable vector). License: Sciicons Pro license. Courtesy: Sciicons. Part of the Analytical Instruments pack.
Keywords: Analytical Instruments Pack, Sciicons Pro, SEM, scanning electron microscope, scanning electron microscopy, electron gun, secondary electrons, backscattered electrons, electron column, analytical chemistry, instrument
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